News

TEVAL has published a new volume of Shiken 28.1 (Nov. 2024)

October 24, 2024 Testing and Evaluation

The TEVAL SIG is pleased to announce it has published another volume of Shiken 28.1 (Nov.2024). Shiken: A Journal of Language Testing and Evaluation in Japan aims to publish articles concerning language assessment issues relevant to assessment professionals, researchers, classroom...

TEVAL has published a new volume of Shiken 27.2 (Dec.2023)

January 12, 2024 Testing and Evaluation

The TEVAL SIG is pleased to announce it has published another volume of Shiken 27.2 (Dec.2023). Shiken: A Journal of Language Testing and Evaluation in Japan aims to publish articles concerning language assessment issues relevant to assessment professionals, researchers, classroom...

TEVAL SIG has published Shiken 27.1 (June 2023)

July 12, 2023 Testing and Evaluation

The TEVAL SIG is pleased to announce it has published another volume of Shiken 27.1 (June 2023). Shiken: A Journal of Language Testing and Evaluation in Japan aims to publish articles concerning language assessment issues relevant to assessment professionals, researchers, classroom...

Professional Certificate in Language Assessment

May 26, 2022 Testing and Evaluation

For anyone interested in learning more about language assessment, we can highly recommend this excellent online course at Melbourne University. As well as topics such as writing test specifications and item writing, it covers assessment-for-learning and issues of test fairness and test...

TEVAL SIG announces new initiatives for 2022

February 9, 2022 Testing and Evaluation

The TEVAL SIG is pleased to announce new initiatives for 2022. Starting this year, we will be sponsoring a new Research Grant and a Conference Grant available to TEVAL Members. Also we will be holding regular, monthly online meetings. TEVAL Talk Time is an informal get together for TEVAL...

TEVAL Publishes "Statistics Corner: Questions and Answers about Language Testing Statistics"

February 25, 2019 Testing and Evaluation

The TEVAL SIG is proud to announce the publication of Statistics Corner: Questions and Answers about Language Testing Statistics (340 pages), written by James Dean Brown, and available for $29.95 on the Amazon website. To receive a free copy, join the TEVAL SIG (2,000 yen). Read more about this...